Title :
VIB-4 temperature dependence of minority electron mobility and bandgap narrowing in p+Si
Author :
Swanson, Richard M.
fDate :
11/1/1987 12:00:00 AM
Keywords :
Bipolar transistors; CMOS technology; Electrodes; Electron mobility; Gratings; Photonic band gap; Scattering; Temperature dependence; Temperature measurement; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1987.23320
