DocumentCode :
1119461
Title :
Tests and measurement
Author :
Riezenman, M.J.
Volume :
33
Issue :
1
fYear :
1996
fDate :
1/1/1996 12:00:00 AM
Firstpage :
65
Lastpage :
69
Abstract :
Fuelled by worldwide semiconductor sales, the test and measurement industry in 1995 enjoyed a year like few others in living memory. This paper presents an overview of test and measurement technologies and highlights: industry searches for the best testability strategy; methods to probe dense integrated circuit boards and wafers; standard approval for a system-level test bus; and how the equipment community is tackling software testing
Keywords :
built-in self test; design for testability; integrated circuit measurement; integrated circuit testing; program testing; test equipment; DFT; circuit measurement; circuit testing; dense boards; dense wafers; software testing; system-level test bus; testability strategy; Circuit testing; Computer industry; Integrated circuit measurements; Integrated circuit technology; Integrated circuit testing; Marketing and sales; Semiconductor device testing; Software measurement; Software testing; System testing;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/6.476734
Filename :
476734
Link To Document :
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