Title :
Viewpoint: Dealing With Yield Losses in Iddq Testing
Author :
Hawkins, C.F. ; Soden, J.M.
Keywords :
Automatic test pattern generation; Automatic testing; Capacitance; Capacitors; Costs; Fixtures; Lead; Polarization; Probes; Software testing;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1996.476735
