DocumentCode
11198
Title
Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits
Author
Chenglin Yang ; Shulin Tian ; Zhen Liu ; Jianguo Huang ; Fang Chen
Author_Institution
Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Volume
62
Issue
10
fYear
2013
fDate
Oct. 2013
Firstpage
2730
Lastpage
2738
Abstract
Due to the lack of a feasible fault modeling method, soft fault diagnosis and tolerance are two challenging problems in analog circuit fault diagnosis. This paper proposes approaches to solve these two problems. First, a new fault modeling method and its theoretical proof are presented. In analog circuits, either the real part (“Ur”) or the imaginary part (“Ui”) of output voltage is the function of fault component parameter “ z,” viz., Ur=f1(z) and Ui=f2(z). By eliminating “ z,” equation F(Ur,Ui)=0 is achieved, where function “ F()” is independent from the value of “ z” and uniquely determined by the location of “ z” and the other fault free component in the circuit under test (CUT). Hence, the function “ F()” can be used as the fault model, which is applicable to both hard (open or short) and soft (parametric) faults. It is also applicable to either linear or nonlinear analog circuits. On a complex plane, the equation “ F(Ur, Ui)=0” represents a curve which is determined by the fault free output voltage and the shape of “ F().” Then, the parameter tolerance is taken into consideration. The tolerance influences the fault diagnosis by shifting the fault free output voltage and distorting the shape of “ F().” These influences can be mitigated in two ways: 1) The free output voltage is measured when an actual circuit is under steady state and free of fault, and 2) the minimal distance approach is used to find the fault component. The effectiveness of the proposed approaches is verified by both simulated and experimental results.
Keywords
analogue circuits; circuit simulation; circuit testing; fault location; fault tolerance; voltage measurement; analog circuit fault diagnosis method; circuit under test; complex plane; fault component parameter; fault free component; fault free output voltage shifting; fault location; fault modeling method; fault tolerance handling method; free output voltage measurement; hard fault; nonlinear analog circuits; shape distortion; soft fault diagnosis; Analog fault diagnosis; fault feature; fault modelling; tolerance;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2013.2259732
Filename
6547722
Link To Document