Title :
Genetic-Algorithm-Based Method for Optimal Analog Test Points Selection
Author :
Golonek, T. ; Rutkowski, J.
Author_Institution :
Inst. of Electron., Tech. Univ. Silesia, Gliwice
Abstract :
A new approach to an optimal analog test points selection is proposed. The described method uses ambiguity set concept and evolutionary computations to determine the optimal set of analog test points. After a brief introduction to analog testing and genetic algorithms, the proposed strategy is explained. The presented evolutionary approach is illustrated by a practical example of analog circuit and by a series of hypothetical circuits. The efficiency of the technique is compared with a method based on entropy index, and the obtained results are discussed
Keywords :
analogue circuits; circuit optimisation; circuit testing; design for testability; genetic algorithms; analog circuit; design for testability; evolutionary computations; genetic algorithm; optimal analog test points selection; Biological cells; Circuit faults; Circuit testing; Computational modeling; Design for testability; Entropy; Frequency measurement; Genetic algorithms; System testing; Time measurement; Analog circuits; analog system testing; design for testability (DfT); genetic algorithms (GAs);
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2006.884112
