DocumentCode :
1119950
Title :
GaAs/AlGaAs heterojunction emitter-down bipolar transistors fabricated on GaAs-on-Si substrate
Author :
Tran, L.T. ; Lee, J.W. ; Shichijo, Hisashi ; Yuan, Han-tzong
Author_Institution :
Texas Instruments Incorporated, Dallas, TX, USA
Volume :
8
Issue :
2
fYear :
1987
fDate :
2/1/1987 12:00:00 AM
Firstpage :
50
Lastpage :
52
Abstract :
GaAs/AlGaAs heterojunction bipolar transistors with emitter-down structure were fabricated on GaAs-on-Si substrate for the first time. A maximum current gain of 25 was measured at a collector current density of 6250 A/cm2. This value is comparable with that from similar devices fabricated on GaAs substrates. This result, along with previous work on large-scale integration of emitter-down transistors, demonstrates the potential for high-level integration of bipolar devices on GaAs-on-Si substrates.
Keywords :
Bipolar transistors; Circuits; Current measurement; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Large scale integration; Rapid thermal annealing; Silicon; Substrates;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26548
Filename :
1487098
Link To Document :
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