Title :
CMOS Multistage Preamplifier Design for High-Speed and High-Resolution Comparators
Author_Institution :
Semicond. Device Dev. Center, Canon Inc., Kanagawa
Abstract :
This brief describes a design technique for multistage preamplifiers of the type commonly used in high-performance comparators. Following the examination of multistage preamplifier responses in both the spectral and time domains, and a consideration 1/f noise attenuation in topologies employing offset storage capacitors, a procedure for optimizing both the number of stages and the offset storage capacitance is presented. As a demonstration vehicle, a comparator with a 13-Msample/s conversion rate and 200-muV minimum input resolution is designed for realization in a 0.4-mum CMOS technology under the constraint of a power dissipation of 250 muW when operating from a 2.5-V supply. In this design, the effective input signal is 33 muV for the minimum input resolution of 200 muV due to signal corruption from circuit noise and residual error from incomplete settling
Keywords :
1/f noise; CMOS analogue integrated circuits; analogue-digital conversion; comparators (circuits); integrated circuit design; integrated circuit noise; preamplifiers; 0.4 micron; 1/f noise attenuation; 2.5 V; 250 muW; CMOS multistage preamplifier; circuit noise; circuit optimization; high-resolution comparators; high-speed comparators; spectral domain; time domains; Attenuation; CMOS technology; Capacitance; Capacitors; Power dissipation; Preamplifiers; Signal design; Signal resolution; Topology; Vehicles; Analog-digital conversion; CMOS analog integrated circuits; circuit noise; circuit optimization; comparators;
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
DOI :
10.1109/TCSII.2006.883091