Title :
Parallel plate resonator for accurate RF surface loss measurements
Author :
Reible, S.A. ; Wilker, C.W.
Author_Institution :
Micrilor Inc., Wakefield, MA, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
An unique resonator structure for measuring RF surface losses in superconductive materials has been developed, and an absolute accuracy of 20% verified by measurements on copper films. The test structure utilizes two unpatterned, rectangular substrates which are pressed together by a spring-pressure arrangement, providing for short measurement turnaround times and rapid assessment of the microwave quality of high-temperature superconducting films. The unbalanced, parallel-plate transmission line structure is capacitively coupled to a pair of input/output leads. With 1-in-long MgO substrates the fundamental resonance is at about 2 GHz. An rms accuracy of several percent has been confirmed by a series of measurement results obtained with this structure on high-quality, superconducting films
Keywords :
high-temperature superconductors; magnesium compounds; materials testing; microwave measurement; quality control; resonators; substrates; 1 in; 2 GHz; MgO substrates; RF surface loss measurements; absolute accuracy; fundamental resonance; high temperature superconductors; high-temperature superconducting films; microwave quality; parallel plate resonator; parallel-plate transmission line; rapid assessment; rectangular substrates; resonator structure; short measurement turnaround times; spring-pressure arrangement; superconductive materials; Copper; Loss measurement; Microwave measurements; Radio frequency; Superconducting films; Superconducting materials; Superconducting transmission lines; Superconductivity; Testing; Transmission line measurements;
Journal_Title :
Magnetics, IEEE Transactions on
