DocumentCode :
1120216
Title :
Submicrometer GaAs MESFET with shallow channel and very high transconductance
Author :
Van Zeghbroeck, Bart J. ; Patrick, W. ; Meier, Heinz ; Vettiger, Peter
Author_Institution :
IBM Research Division, Rüschlikon, Switzerland
Volume :
8
Issue :
3
fYear :
1987
fDate :
3/1/1987 12:00:00 AM
Firstpage :
118
Lastpage :
120
Abstract :
A 0.5-µm GaAs MESFET with a 25-nm thin channel, 400- mS/mm maximum transconductance, and 580-mS/V.mm K value is presented. This extremely high K value was obtained using an electron-beam fabricated recessed-gate MESFET structure on a highly doped (9.1017cm-3) MBE-grown channel layer with 2600-cm2/V.s mobility. The use of thin channels and a buried p-layer also reduced the output conductance and other short-channel effects dramatically. As a result, these scaled MESFET´s are very promising for high-speed digital logic circuits.
Keywords :
Capacitance; Gallium arsenide; High K dielectric materials; High-K gate dielectrics; Lithography; Logic circuits; Logic devices; MESFET circuits; Threshold voltage; Transconductance;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26572
Filename :
1487122
Link To Document :
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