• DocumentCode
    1120216
  • Title

    Submicrometer GaAs MESFET with shallow channel and very high transconductance

  • Author

    Van Zeghbroeck, Bart J. ; Patrick, W. ; Meier, Heinz ; Vettiger, Peter

  • Author_Institution
    IBM Research Division, Rüschlikon, Switzerland
  • Volume
    8
  • Issue
    3
  • fYear
    1987
  • fDate
    3/1/1987 12:00:00 AM
  • Firstpage
    118
  • Lastpage
    120
  • Abstract
    A 0.5-µm GaAs MESFET with a 25-nm thin channel, 400- mS/mm maximum transconductance, and 580-mS/V.mm K value is presented. This extremely high K value was obtained using an electron-beam fabricated recessed-gate MESFET structure on a highly doped (9.1017cm-3) MBE-grown channel layer with 2600-cm2/V.s mobility. The use of thin channels and a buried p-layer also reduced the output conductance and other short-channel effects dramatically. As a result, these scaled MESFET´s are very promising for high-speed digital logic circuits.
  • Keywords
    Capacitance; Gallium arsenide; High K dielectric materials; High-K gate dielectrics; Lithography; Logic circuits; Logic devices; MESFET circuits; Threshold voltage; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26572
  • Filename
    1487122