Target Above Random Rough Surface Scattering Using a Parallelized IPO Accelerated by MLFMM

Author

Rashidi-Ranjbar, Ehsan ; Dehmollaian, Mojtaba

Author_Institution

Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran

Volume

12

Issue

7

fYear

2015

fDate

Jul-15

Firstpage

1481

Lastpage

1485

Abstract

The radar cross section (RCS) of targets above random rough surfaces having impedance boundaries is evaluated using a developed parallelized iterative physical optics. Integral calculations are accelerated using the multilevel fast multipole method (MLFMM). For example, the RCS of a boat above a Gaussian random rough surface occupying a (100/3λ)3 volume, with λ being the wavelength at the operation frequency of 1 GHz for one incidence angle, is computed within about 42 s. The result is verified with method of moment-MLFMM which takes about 9.4 min. The backscatter RCS of a (9λ)³ dihedral above a random rough surface for different root-mean-square (rms) heights, correlation lengths, and incidence angles is examined. It is shown that a rough surface with an rms height of 0.2λ and a correlation length of λ can decrease/increase the RCS of a vertically placed impedance dihedral corner reflector by about 5 dB at an elevation angle of 45°.

Keywords

Gaussian processes; backscatter; iterative methods; physical optics; radar cross-sections; random processes; rough surfaces; surface roughness; Gaussian random rough surface; backscatter RCS; correlation length; frequency 1 GHz; incidence angle; moment-MLFMM; multilevel fast multipole method; parallelized IPO acceleration; parallelized iterative physical optics; radar cross section; rms; root-mean-square; target above random rough surface scattering; Correlation; Rough surfaces; Scattering; Sea surface; Surface impedance; Surface roughness; Surface waves; Approximate high-frequency techniques; hybrid solution methods; multilevel fast multipole method (MLFMM); radar cross section (RCS) computation;

fLanguage

English

Journal_Title

Geoscience and Remote Sensing Letters, IEEE

Publisher

ieee

ISSN

1545-598X

Type

jour

DOI

10.1109/LGRS.2015.2409555

Filename

7065269