Title :
Characteristics of the electrical response of YBCO films with different morphologies to optical irradiation
Author :
Track, E.K. ; Madhavrao, L. ; Patt, R. ; Drake, RE ; Radparvar, M.
Author_Institution :
Hypres Inc., Elmsford, NY, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
YBCO films of varying thicknesses (200-3000 Å) and morphologies, have been fabricated, and their electrical response to optical radiation has been measured. A report on these measurements, emphasizing the dependence on temperature, light chopping frequency, and cryogenic environment is presented. The temperature dependence of the film resistance is determined in part by the film morphology. This morphology may be represented by a simple model consisting of a two-dimensional array of coupled grains. The magnitude of the bolometric response correlates with the sharpness of the superconducting transition. These measurements and observations lead to a proposed optimization scheme to maximize the low-temperature response and fully explore the potential for fast nonequilibrium detectors
Keywords :
barium compounds; high-temperature superconductors; photoelectricity; superconducting thin films; yttrium compounds; 200 to 3000 A; YBa2Cu3O7-x; bolometric response; cryogenic environment; dependence on temperature; electrical response to optical radiation; fast nonequilibrium detectors; film resistance; high temperature superconductors; light chopping frequency; morphologies; optimization scheme; thicknesses; two-dimensional array of coupled grains; Cryogenics; Electric variables measurement; Electrical resistance measurement; Frequency measurement; Morphology; Optical films; Superconducting films; Temperature dependence; Thickness measurement; Yttrium barium copper oxide;
Journal_Title :
Magnetics, IEEE Transactions on
