Title :
Parasitic bipolar effects in submicrometer GaAs MESFET´s
Author :
Van Zeghbroeck, Bart J. ; Patrick, W. ; Meier, Heinz ; Vettiger, Peter
Author_Institution :
IBM Research Division, Rüschlikon, Switzerland
fDate :
5/1/1987 12:00:00 AM
Abstract :
We report the observation for the first time of parasitic bipolar action in GaAs MESFET´s. It manifests itself in the form of increased transconductance at higher drain voltage, abrupt change in output conductance (kink effect) around 4-V drain-source voltage, and a gate-voltage-dependent substrate current. These effects are explained by electron-hole pair generation in the high-field region at the drain. The holes generated are injected into the substrate where they form the base region of a parasitic lateral bipolar transistor. The effect also explains a new breakdown mechanism for short-channel enhancement-mode MESFET´s.
Keywords :
Bipolar transistors; Breakdown voltage; Diodes; Doping; Electric breakdown; Gallium arsenide; High power microwave generation; MESFETs; Temperature; Transconductance;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1987.26598