• DocumentCode
    1120708
  • Title

    Submicrometer fully self-aligned AlGaAs/GaAs Heterojunction bipolar transistor

  • Author

    Hayama, Nobuyuki ; Okamoto, Akihiko ; Madihian, Mohammad ; Honjo, Kazuhiko

  • Author_Institution
    NEC Corporation, Kawasaki, Japan
  • Volume
    8
  • Issue
    5
  • fYear
    1987
  • fDate
    5/1/1987 12:00:00 AM
  • Firstpage
    246
  • Lastpage
    248
  • Abstract
    A novel submicrometer fully self-aligned AlGaAs/GaAs heterojunction bipolar transistor (HBT) for reducing parasitic capacitances and resistances is proposed. The fabrication process utilizes SiO2sidewalls for defining base electrode width and separating this electrode from both emitter and collector electrodes. Measured common-emitter current gain β for a fabricated HBT with 0.6 × 10-µm2emitter dimension and 0.7 × 10-µm2× 2 base dimension is 26 at 9 × 104-A/cm2collector current density.
  • Keywords
    Current density; Current measurement; Density measurement; Electrical resistance measurement; Electrodes; Fabrication; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Parasitic capacitance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26618
  • Filename
    1487168