DocumentCode
1120708
Title
Submicrometer fully self-aligned AlGaAs/GaAs Heterojunction bipolar transistor
Author
Hayama, Nobuyuki ; Okamoto, Akihiko ; Madihian, Mohammad ; Honjo, Kazuhiko
Author_Institution
NEC Corporation, Kawasaki, Japan
Volume
8
Issue
5
fYear
1987
fDate
5/1/1987 12:00:00 AM
Firstpage
246
Lastpage
248
Abstract
A novel submicrometer fully self-aligned AlGaAs/GaAs heterojunction bipolar transistor (HBT) for reducing parasitic capacitances and resistances is proposed. The fabrication process utilizes SiO2 sidewalls for defining base electrode width and separating this electrode from both emitter and collector electrodes. Measured common-emitter current gain β for a fabricated HBT with 0.6 × 10-µm2emitter dimension and 0.7 × 10-µm2× 2 base dimension is 26 at 9 × 104-A/cm2collector current density.
Keywords
Current density; Current measurement; Density measurement; Electrical resistance measurement; Electrodes; Fabrication; Gain measurement; Gallium arsenide; Heterojunction bipolar transistors; Parasitic capacitance;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1987.26618
Filename
1487168
Link To Document