DocumentCode :
1120830
Title :
MESFET´s on a GaAs-on-insulator structure
Author :
Tsutsui, Kazuo ; Nakazawa, Tadao ; Asano, Tanemasa ; Ishiwara, Hiroshi ; Furukawa, S.
Author_Institution :
Tokyo Institute of Technology, Yokohama, Japan
Volume :
8
Issue :
6
fYear :
1987
fDate :
6/1/1987 12:00:00 AM
Firstpage :
277
Lastpage :
279
Abstract :
MESFET´s were fabricated on a GaAs-on-insulator structure which was grown by molecular beam epitaxy (MBE) on a GaAs substrate covered with a crystalline insulator film, CaxSr1-xF2. The gmvalue of 71 mS/mm was obtained for an FET with a gate length of 3 µm. Complete isolation of MESFET´s by island formation of GaAs on the fluoride films was also attained for the first time using a conventional wet etching process.
Keywords :
Dielectrics and electrical insulation; Etching; FETs; Gallium arsenide; High speed integrated circuits; Lattices; MESFETs; Molecular beam epitaxial growth; Substrates; Temperature;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26629
Filename :
1487179
Link To Document :
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