• DocumentCode
    1120830
  • Title

    MESFET´s on a GaAs-on-insulator structure

  • Author

    Tsutsui, Kazuo ; Nakazawa, Tadao ; Asano, Tanemasa ; Ishiwara, Hiroshi ; Furukawa, S.

  • Author_Institution
    Tokyo Institute of Technology, Yokohama, Japan
  • Volume
    8
  • Issue
    6
  • fYear
    1987
  • fDate
    6/1/1987 12:00:00 AM
  • Firstpage
    277
  • Lastpage
    279
  • Abstract
    MESFET´s were fabricated on a GaAs-on-insulator structure which was grown by molecular beam epitaxy (MBE) on a GaAs substrate covered with a crystalline insulator film, CaxSr1-xF2. The gmvalue of 71 mS/mm was obtained for an FET with a gate length of 3 µm. Complete isolation of MESFET´s by island formation of GaAs on the fluoride films was also attained for the first time using a conventional wet etching process.
  • Keywords
    Dielectrics and electrical insulation; Etching; FETs; Gallium arsenide; High speed integrated circuits; Lattices; MESFETs; Molecular beam epitaxial growth; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26629
  • Filename
    1487179