• DocumentCode
    1121003
  • Title

    Analogue and mixed-signal test for systems on chip

  • Author

    Sun, Yue

  • Volume
    151
  • Issue
    4
  • fYear
    2004
  • Firstpage
    335
  • Lastpage
    336
  • Abstract
    Reports some advances in the research of DFT, BIST, digital test methods, on-chip test and robust diagnosis of analogue and mixed-signal circuits. Analogue and mixed-signal components most widely used in SoCs are all covered, including filters, amplifiers, data converters, /spl Sigma//spl Delta/-modulators, phase-locked loops and frequency synthesisers.
  • Keywords
    analogue integrated circuits; built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; BIST; DFT; EA-modulators; amplifiers; analogue circuits; data converters; digital test methods; filters; frequency synthesisers; mixed-signal circuits; on-chip test; phase-locked loops; systems on chip;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:20040924
  • Filename
    1338146