DocumentCode
1121107
Title
A new three-terminal tunnel device
Author
Banerjee, Sanjay ; Richardson, William ; Coleman, Jim ; Chatterjee, Amitava
Author_Institution
Texas Instruments Incorporated, Dallas, TX
Volume
8
Issue
8
fYear
1987
fDate
8/1/1987 12:00:00 AM
Firstpage
347
Lastpage
349
Abstract
A Zener effect has been identified in the trench transistor cell (TTC) which is used in Texas Instruments´ 4-Mbit DRAM. This paper discusses a closed-form analytical model for the tunneling current in the TTC. The effect is also verified in a novel planar MOS structure.
Keywords
Analytical models; Capacitors; Doping; Electrons; Instruments; Photonic band gap; Random access memory; Substrates; Tunneling; Voltage;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1987.26655
Filename
1487205
Link To Document