• DocumentCode
    1121167
  • Title

    Pulsed Electric Strength of Vacuum Gaps

  • Author

    Emelyanov, Alexander ; Emelyanova, Ekaterina

  • Author_Institution
    Oryol State Tech. Univ., Oryol
  • Volume
    15
  • Issue
    2
  • fYear
    2008
  • fDate
    4/1/2008 12:00:00 AM
  • Firstpage
    591
  • Lastpage
    599
  • Abstract
    To plot unified dependences of breakdown voltage and electric strength on gap spacing, known experimental data for breakdown delay time in vacuum are analyzed and generalized. Analysis and generalization are realized from positions of the cathode- initiated breakdown. The data, which correspond to optimal modes of conditioning and are received at different experimental conditions for pulses of different shapes and durations in electric fields with a different degree of heterogeneity, are resulted in unified conditions for uniform field and rectangular pulse with given duration. Dependences of breakdown voltage Ubr(d) and electric strength E0br(d) on gap spacing d for copper electrodes in range 3times10-3 les d les 2times102 mm are plotted. At plotting curves Ubr(d) and E0br(d), the total voltage effect is considered. At pulses duration of tp = 0.5 mus, the breakdown voltage makes up 2.5 kV for d = 3 mum and rises with interelectrode distance by three orders of magnitude up to 5 MV for d = 20 cm. The electric strength increases ~ 30 times from 2.5times107 V/m for d = 20 cm up to 7.5 times 108 V/m for d = 3 mum with decrease in gap spacing.
  • Keywords
    electric fields; insulator testing; vacuum breakdown; vacuum insulation; breakdown delay time; breakdown voltage; cathode-initiated breakdown; copper electrodes; pulsed electric strength; vacuum gaps; Breakdown voltage; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Heat transfer; Pulse shaping methods; Shape; Thermal conductivity; Vacuum breakdown; Vacuum technology;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2008.4483481
  • Filename
    4483481