• DocumentCode
    1121169
  • Title

    Fabrication and characterization of YBCO microstrip delay lines

  • Author

    Track, E.K. ; Hohenwarter, G.K.G. ; Madhavrao, L.R. ; Patt, R. ; Drake, R.E. ; Radparvar, M.

  • Author_Institution
    Hypres Inc., Elmsford, NY, USA
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    2936
  • Lastpage
    2939
  • Abstract
    Microstrip delay lines with YBCO films as the material for the strip and polished bulk copper for the ground plane have been fabricated and characterized. The film-carrying LaAlO3 substrate is flipped over the copper ground plane and separated from it by a polyimide laminate that acts as the microstrip dielectric. Linewidths are varied from 100 to 600 μm, total length from 10 to 65 cm. Two winding shapes, concentric circular and serpentine, are evaluated. For a total geometric length of 60 cm, time domain reflectometry measured delay of 5 ns is obtained with a line impedance of 50 Ω. These delay lines require an area of high-quality YBCO films of 1 in2 . The directly measured transmission loss (S21) up to 10 GHz is ten times lower at 77 K than for identical lines made with gold films and comparable at 4.2 K to the loss of identical lines made with niobium films. The design constraints, fabrication, and properties of these lines and the issues involved in obtaining longer delays are discussed
  • Keywords
    barium compounds; delay lines; high-temperature superconductors; solid-state microwave devices; strip line components; superconducting thin films; yttrium compounds; 10 GHz; 5 ns; 77 K; LaAlO3 substrate; YBaCuO-LaAlO3; fabrication; high temperature superconductors; microstrip delay lines; polished bulk Cu; polyimide laminate; transmission loss; winding shapes; Delay lines; Dielectric materials; Dielectric substrates; Fabrication; Laminates; Microstrip; Polyimides; Propagation losses; Strips; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133824
  • Filename
    133824