• DocumentCode
    112122
  • Title

    Influence of High-Frequency Near-Field Coupling Between Magnetic Components on EMI Filter Design

  • Author

    Ruxi Wang ; Blanchette, Handy Fortin ; Mingkai Mu ; Boroyevich, Dushan ; Mattavelli, Paolo

  • Author_Institution
    Center for Power Electron. Syst., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    28
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    4568
  • Lastpage
    4579
  • Abstract
    This study presents a detailed analysis of magnetic component coupling and its influence on electromagnetic interference filter design. In contrast with other literature, the novelty of this paper reveals that magnetic coupling should be divided into two categories: low-frequency coupling and high-frequency coupling. It is proven that coupling is frequency related and high-frequency near-field stray flux distribution can be differ dramatically from low-frequency condition. The change of the near-field stray flux distribution is caused by displacement current from stray capacitors. By using the Biot-Savart equation, high-frequency near-field distribution can be well predicted and matched with experimental results. In addition, single stage differential mode (DM) LC filters are utilized to demonstrate the influence of high-frequency coupling.
  • Keywords
    electromagnetic interference; radiofrequency filters; Biot-Savart equation; EMI filter; differential mode LC filters; electromagnetic interference filter design; high-frequency near field coupling; high-frequency near field stray flux distribution; magnetic component coupling; stray capacitors; Couplings; Electromagnetic interference; Magnetic flux; Magnetic noise; Magnetic separation; Magnetic shielding; Resonant frequency; Electromagnetic interference (EMI) filter; magnetic coupling; mutual coupling; near-field probe;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2012.2237414
  • Filename
    6401200