DocumentCode :
112138
Title :
High-Performance MIM Capacitors With Nanomodulated Electrode Surface
Author :
Hourdakis, Emmanouel ; Travlos, Anastassios ; Nassiopoulou, Androula G.
Author_Institution :
Nat. Center for Sci. Res. Demokritos, Inst. of Nanosci. & Nanotechnol., Athens, Greece
Volume :
62
Issue :
5
fYear :
2015
fDate :
May-15
Firstpage :
1568
Lastpage :
1573
Abstract :
We report on a high-performance metal-insulator- metal (MIM) capacitor using a barrier-type anodic alumina as dielectric and exhibiting a capacitance density as high as 10 fF/μm2 with leakage current density lower than 10-8 A/cm2. The device is shown to be very stable in terms of frequency, showing a capacitance variation less than 3% in the frequency range between 103 and 106 Hz. A loss tangent <;0.1 is shown for the anodic alumina used. Moreover, by introducing nanomodulation to the capacitor electrode, the effective surface area of the capacitor is increased, allowing the use of thicker dielectric layers for the same value of capacitance density. The use of thicker dielectric layers is shown to decrease the leakage current by an order of magnitude and the nonlinearity coefficient α by a factor of 1.8 for the larger capacitance density devices. These results suggest a novel strategy for reducing the α coefficient of a MIM capacitor without decreasing the capacitance density.
Keywords :
MIM devices; alumina; capacitors; current density; dielectric materials; electrodes; leakage currents; losses; barrier-type anodic alumina; capacitance density device; capacitance variation; dielectric layers; electrode surface nanomodulation; high-performance MIM Capacitors; high-performance metal-insulator-metal capacitor; leakage current density; loss tangent; magnitude coefficient; nonlinearity coefficient; surface area; Capacitance; Capacitors; Electrodes; Fabrication; Leakage currents; MIM capacitors; Anodic alumina; high- $k$ dielectric; high-k dielectric; metal-insulator-metal (MIM) capacitor.; metal???insulator???metal (MIM) capacitor;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2411771
Filename :
7065297
Link To Document :
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