DocumentCode :
1121386
Title :
High-performance self-aligned gate AlGaAs/GaAs MODFET voltage comparator
Author :
Vold, P.J. ; Arch, David K. ; Tan, K.L. ; Akinwande, A.I. ; Cirillo, Nicholas C., Jr.
Author_Institution :
Honeywell Physical Sciences Center, Bloomington, MN
Volume :
8
Issue :
9
fYear :
1987
fDate :
9/1/1987 12:00:00 AM
Firstpage :
431
Lastpage :
433
Abstract :
A very high-performance voltage comparator circuit has been demonstrated using self-aligned gate AlGaAs/GaAs modulation-doped FET´s (MODFET´s)and laser-trimmable CrSi-based thin-film resistors. The MODFET master/slave comparator circuits demonstrated analog input resolutions of < 1 and 2.5 mV at sampling rates of 0.5 and 1 GHz, respectively, at Nyquist analog input rates at room temperature. The MODFET comparators operated to sampling rates greater than 2.5 GHz at Nyquist analog input rates. Static hysteresis of less than 1 mV was observed for some comparators at room temperature. The self-aligned gate MODFET´s demonstrated average threshold-voltage offsets for closely spaced FET pairs of 2.53 ± 1.15 mV, and typical static hysteresis levels of < 1 to 3 mV. These MODFET comparators demonstrated the highest analog input resolution at gigahertz sampling frequencies ever reported, including comparators fabricated using AlGaAs/GaAs heterojunction bipolar transistors (HBT´s).
Keywords :
Epitaxial layers; FETs; Gallium arsenide; HEMTs; Hysteresis; MODFET circuits; Sampling methods; Temperature; Thin film circuits; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26683
Filename :
1487233
Link To Document :
بازگشت