• DocumentCode
    1121675
  • Title

    Design of a Transition-Edge Hot-Electron Microbolometer for Millimeter-Wave Astrophysical Observations

  • Author

    Barrentine, Emily M. ; Ali, Shafinaz ; Allen, Christine A. ; Brown, Ari D. ; Cao, Nga T. ; Chervenak, James A. ; Denis, Kevin L. ; Hsieh, Wen-Ting ; Miller, Timothy M. ; Moseley, S. Harvey ; Stevenson, Thomas R. ; Timbie, Peter T. ; Travers, Douglas E. ;

  • Author_Institution
    Univ. of Wisconsin, Madison, WI, USA
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    528
  • Lastpage
    531
  • Abstract
    We are developing a Transition-edge Hot-electron Microbolometer (THM) with the capacity to make sensitive and broadband astrophysical observations over frequencies ranging from 30-300 GHz (10-1 mm). This micron-sized bolometer consists of a superconducting bilayer Transition-Edge Sensor (TES) and a thin-film absorber. The THM employs the decoupling between electrons and phonons at low temperatures (below 300 mK) to provide thermal isolation. The devices are fabricated photolithographically and read out with Superconducting Quantum Interference Devices (SQUIDs). We present the details of a thermal model for a THM detector and the design for new thermally optimized antenna-coupled THMs for illumination by a RF source at 40 and 100 GHz.
  • Keywords
    SQUIDs; aerospace engineering; antennas; astronomical instruments; bolometers; millimetre waves; photolithography; thin film sensors; SQUID; Superconducting Quantum Interference Devices; TES; THM design; THM detector; Transition-edge Hot-electron Microbolometer; antenna; bilayer Transition-Edge Sensor; electrons; frequency 30 GHz to 300 GHz; millimeter-wave astrophysical observation; phonons; photolithography; thermal isolation; thermal model; thin-film absorber; Bolometers; hot-electron; millimeter wave detectors; superconducting sensors;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2017956
  • Filename
    5152996