DocumentCode :
1121732
Title :
Epitaxially grown base transistor for high-speed operation
Author :
Sugii, T. ; Yamazaki, T. ; Fukano, T. ; Ito, T.
Author_Institution :
Fujitsu Laboratories, Ltd., Atsugi, Japan
Volume :
8
Issue :
11
fYear :
1987
fDate :
11/1/1987 12:00:00 AM
Firstpage :
528
Lastpage :
530
Abstract :
We developed a transistor with a very thin base to improve the speed of the intrinsic bipolar transistor. The epitaxially grown base transistor, or EBT, consists of an in-situ boron-doped epitaxial base layer that is photochemically grown, Photoepitaxy, with a low growth temperature of about 650°C, enables us to fabricate a very thin heavily doped layer. Our EBT has a base 65 nm thick and a peak boron concentration of 1 × 1019/cm3. Compared with high-speed bipolar transistors reported to date, EBT´s have half the base width and ten times the peak boron concentration. The maximum current gain was about 500. Despite the very thin base, the Early voltage was about 70 V because of the high boron concentration. The EBT is potentially capable of very high-speed operation if combined with a structure that minimizes parasitic capacitance.
Keywords :
Annealing; Boron; Crystallization; Electrodes; Epitaxial layers; Etching; Fabrication; Photonic band gap; Substrates; Voltage;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26717
Filename :
1487267
Link To Document :
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