• DocumentCode
    1121732
  • Title

    Epitaxially grown base transistor for high-speed operation

  • Author

    Sugii, T. ; Yamazaki, T. ; Fukano, T. ; Ito, T.

  • Author_Institution
    Fujitsu Laboratories, Ltd., Atsugi, Japan
  • Volume
    8
  • Issue
    11
  • fYear
    1987
  • fDate
    11/1/1987 12:00:00 AM
  • Firstpage
    528
  • Lastpage
    530
  • Abstract
    We developed a transistor with a very thin base to improve the speed of the intrinsic bipolar transistor. The epitaxially grown base transistor, or EBT, consists of an in-situ boron-doped epitaxial base layer that is photochemically grown, Photoepitaxy, with a low growth temperature of about 650°C, enables us to fabricate a very thin heavily doped layer. Our EBT has a base 65 nm thick and a peak boron concentration of 1 × 1019/cm3. Compared with high-speed bipolar transistors reported to date, EBT´s have half the base width and ten times the peak boron concentration. The maximum current gain was about 500. Despite the very thin base, the Early voltage was about 70 V because of the high boron concentration. The EBT is potentially capable of very high-speed operation if combined with a structure that minimizes parasitic capacitance.
  • Keywords
    Annealing; Boron; Crystallization; Electrodes; Epitaxial layers; Etching; Fabrication; Photonic band gap; Substrates; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/EDL.1987.26717
  • Filename
    1487267