DocumentCode :
1121734
Title :
High quality Nb-AlOx-Nb junctions for microwave receivers and SFQ logic device
Author :
Koshelets, V.P. ; Kovtonyuk, S.A. ; Serpuchenko, I.L. ; Filippenko, L.V. ; Shchukin, A.V.
Author_Institution :
Inst. of Radioeng. & Electron., Acad. of Sci., Moscow, USSR
Volume :
27
Issue :
2
fYear :
1991
fDate :
3/1/1991 12:00:00 AM
Firstpage :
3141
Lastpage :
3144
Abstract :
The specific capacitance of high-quality (Vm>50 mV) Nb-AlOx-Nb tunnel junctions is determined by the following methods: the measurement of zero field step resonances in specially prepared long Josephson junctions, and the definition of the resonant voltages in two-junction interferometers based on Nb-AlOx-Nb junctions. The results obtained by these methods were compared with each other and with the figures calculated from the measurements of tunnel barrier parameters. The application of the procedure for the fabrication of single flux quantum (SFQ) logic devices is discussed
Keywords :
aluminium compounds; niobium; superconducting junction devices; superconducting logic circuits; Nb-AlOx-Nb tunnel junctions; SFQ logic device; high quality junctions; long Josephson junctions; microwave receivers; resonant voltages; single flux quantum logic devices; specific capacitance; two-junction interferometers; zero field step resonances; Capacitance measurement; Circuits; Critical current density; Current measurement; Fabrication; Josephson junctions; Logic devices; Microwave devices; Resonance; SQUIDs;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.133877
Filename :
133877
Link To Document :
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