• DocumentCode
    1121734
  • Title

    High quality Nb-AlOx-Nb junctions for microwave receivers and SFQ logic device

  • Author

    Koshelets, V.P. ; Kovtonyuk, S.A. ; Serpuchenko, I.L. ; Filippenko, L.V. ; Shchukin, A.V.

  • Author_Institution
    Inst. of Radioeng. & Electron., Acad. of Sci., Moscow, USSR
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    3141
  • Lastpage
    3144
  • Abstract
    The specific capacitance of high-quality (Vm>50 mV) Nb-AlOx-Nb tunnel junctions is determined by the following methods: the measurement of zero field step resonances in specially prepared long Josephson junctions, and the definition of the resonant voltages in two-junction interferometers based on Nb-AlOx-Nb junctions. The results obtained by these methods were compared with each other and with the figures calculated from the measurements of tunnel barrier parameters. The application of the procedure for the fabrication of single flux quantum (SFQ) logic devices is discussed
  • Keywords
    aluminium compounds; niobium; superconducting junction devices; superconducting logic circuits; Nb-AlOx-Nb tunnel junctions; SFQ logic device; high quality junctions; long Josephson junctions; microwave receivers; resonant voltages; single flux quantum logic devices; specific capacitance; two-junction interferometers; zero field step resonances; Capacitance measurement; Circuits; Critical current density; Current measurement; Fabrication; Josephson junctions; Logic devices; Microwave devices; Resonance; SQUIDs;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133877
  • Filename
    133877
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1121734