• DocumentCode
    1121737
  • Title

    Design, Implementation and On-Chip High-Speed Test of SFQ Half-Precision Floating-Point Multiplier

  • Author

    Hara, Hiroshi ; Obata, Koji ; Park, Heejoung ; Yamanashi, Yuki ; Taketomi, Kazuhiro ; Yoshikawa, Nobuyuki ; Tanaka, Masamitsu ; Fujimaki, Akira ; Takagi, N. ; Takagi, Kazuyoshi ; Nagasawa, S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    657
  • Lastpage
    660
  • Abstract
    We are developing a large-scale reconfigurable data path (LSRDP) using single-flux-quantum (SFQ) circuits as a fundamental technology that can overcome the power-consumption and memory-wall problems in CMOS microprocessors in future high-end computing systems. An SFQ LSRDP is composed of several thousands of SFQ floating-point units connected by reconfigurable SFQ network switches to achieve high performance with low power consumption. In this study, we designed and implemented an SFQ floating-point multiplier (FPM), which is one of the key components of the SFQ LSRDP. We designed a systolic-array bit-serial half-precision FPM using the 2.5 kA/cm2 Nb process. The resultant circuit area and number of Josephson junctions are 6.22 mm times 3.78 mm and 11044, respectively. The designed clock frequency is 25 GHz. We tested the circuit and confirmed the correct operation of the FPM by on-chip high-speed tests.
  • Keywords
    CMOS integrated circuits; microprocessor chips; CMOS microprocessors; Josephson junctions; SFQ half-precision floating-point multiplier; clock frequency; frequency 25 GHz; high-end computing systems; large-scale reconfigurable data path; single-flux-quantum circuits; systolic-array bit-serial half-precision FPM; Floating point units; LSRDP; SFQ circuits; multiplier; superconducting integrated circuits;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2018039
  • Filename
    5153003