Title :
Multiple Resolution Texture Analysis and Classification
Author :
Peleg, Shmuel ; Naor, Joseph ; Hartley, Ralph ; Avnir, David
Author_Institution :
Center for Automation Research, University of Maryland, College Park, MD 20742; Department of Computer Science, the Hebrew University of Jerusalem, 91904 Jerusalem, Israel.
fDate :
7/1/1984 12:00:00 AM
Abstract :
Textures are classified based on the change in their properties with changing resolution. The area of the gray level surface is measured at serveral resolutions. This area decreases at coarser resolutions since fine details that contribute to the area disappear. Fractal properties of the picture are computed from the rate of this decrease in area, and are used for texture comparison and classification. The relation of a texture picture to its negative, and directional properties, are also discussed.
Keywords :
Area measurement; Automation; Chemistry; Computer science; Educational institutions; Fractals; Length measurement; Performance analysis; Surface treatment; Vehicles; Fractals; fractal signature; multiresolution methods; texture classification;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.1984.4767557
