Title :
Laser-patterned interconnect for thin-film hybrid wafer-scale circuits
Author :
Tuckerman, David B.
Author_Institution :
Lawrence Livermore National Laboratory, Livermore, CA
fDate :
11/1/1987 12:00:00 AM
Abstract :
High-performance electronic systems are often constrained by conventional packaging and interconnection technologies. A new technique is described for electrically connecting integrated circuit chips to a silicon wafer interconnection substrate, enabling future fabrication of hybrid wafer-scale circuits to be performed exclusively with thin-film interconnection technology. Thin-film wiring is fabricated down beveled edges of the chips and patterned using discretionary laser etching techniques. Interconnections on a 25-µm pitch (1600 wires around a 1-cm square chip) were achieved with this approach. Functioning hybrid memory modules have been fabricated to demonstrate feasibility of the technology.
Keywords :
Electronics packaging; Hybrid integrated circuits; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Joining processes; Optical device fabrication; Silicon; Substrates; Thin film circuits;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1987.26721