DocumentCode :
1121767
Title :
Laser-patterned interconnect for thin-film hybrid wafer-scale circuits
Author :
Tuckerman, David B.
Author_Institution :
Lawrence Livermore National Laboratory, Livermore, CA
Volume :
8
Issue :
11
fYear :
1987
fDate :
11/1/1987 12:00:00 AM
Firstpage :
540
Lastpage :
543
Abstract :
High-performance electronic systems are often constrained by conventional packaging and interconnection technologies. A new technique is described for electrically connecting integrated circuit chips to a silicon wafer interconnection substrate, enabling future fabrication of hybrid wafer-scale circuits to be performed exclusively with thin-film interconnection technology. Thin-film wiring is fabricated down beveled edges of the chips and patterned using discretionary laser etching techniques. Interconnections on a 25-µm pitch (1600 wires around a 1-cm square chip) were achieved with this approach. Functioning hybrid memory modules have been fabricated to demonstrate feasibility of the technology.
Keywords :
Electronics packaging; Hybrid integrated circuits; Integrated circuit interconnections; Integrated circuit packaging; Integrated circuit technology; Joining processes; Optical device fabrication; Silicon; Substrates; Thin film circuits;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1987.26721
Filename :
1487271
Link To Document :
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