• DocumentCode
    1121784
  • Title

    Electrical fuse lets chips heal themselves

  • Author

    Geppert, L.

  • Volume
    41
  • Issue
    10
  • fYear
    2004
  • Firstpage
    16
  • Lastpage
    20
  • Abstract
    The electronic system of the future will monitor itself, change the functions it performs, and repair its damaged circuits-all without external intervention. Such is the dream of autonomic computing. Although the dream is not yet reality, engineers and scientists at IBM Corp. have taken a big step with the development of an on-chip fuse that is electrically blown-or programmed, as the company prefers to call the process-by using a physical effect heretofore considered a serious reliability problem in semiconductor circuits. According to IBM, combining the new eFuse technology with already available on-chip built-in self-test and -repair circuitry will yield a chip capable of diagnosing its failures and then fixing them by blowing fuses to reroute its circuits.
  • Keywords
    built-in self test; electric fuses; electromigration; integrated circuit reliability; monolithic integrated circuits; semiconductor device reliability; eFuse technology; electric fuse; electrically programmable fuses; fault diagnosis; on chip fuse; self healing circuit; semiconductor circuit reliability; Circuits; Detectors; Fuses; Laboratories; Large Hadron Collider; Large-scale systems; Linear particle accelerator; Magnetic analysis; Switches; Voltage;
  • fLanguage
    English
  • Journal_Title
    Spectrum, IEEE
  • Publisher
    ieee
  • ISSN
    0018-9235
  • Type

    jour

  • DOI
    10.1109/MSPEC.2004.1338777
  • Filename
    1338777