DocumentCode
1121784
Title
Electrical fuse lets chips heal themselves
Author
Geppert, L.
Volume
41
Issue
10
fYear
2004
Firstpage
16
Lastpage
20
Abstract
The electronic system of the future will monitor itself, change the functions it performs, and repair its damaged circuits-all without external intervention. Such is the dream of autonomic computing. Although the dream is not yet reality, engineers and scientists at IBM Corp. have taken a big step with the development of an on-chip fuse that is electrically blown-or programmed, as the company prefers to call the process-by using a physical effect heretofore considered a serious reliability problem in semiconductor circuits. According to IBM, combining the new eFuse technology with already available on-chip built-in self-test and -repair circuitry will yield a chip capable of diagnosing its failures and then fixing them by blowing fuses to reroute its circuits.
Keywords
built-in self test; electric fuses; electromigration; integrated circuit reliability; monolithic integrated circuits; semiconductor device reliability; eFuse technology; electric fuse; electrically programmable fuses; fault diagnosis; on chip fuse; self healing circuit; semiconductor circuit reliability; Circuits; Detectors; Fuses; Laboratories; Large Hadron Collider; Large-scale systems; Linear particle accelerator; Magnetic analysis; Switches; Voltage;
fLanguage
English
Journal_Title
Spectrum, IEEE
Publisher
ieee
ISSN
0018-9235
Type
jour
DOI
10.1109/MSPEC.2004.1338777
Filename
1338777
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