DocumentCode :
1121859
Title :
HEMT-Based Readout Technique for Dark- and Photon-Count Studies in NbN Superconducting Single-Photon Detectors
Author :
Kitaygorsky, Jennifer ; Dorenbos, Sander ; Reiger, Elisabeth ; Schouten, Raymond ; Zwiller, Val ; Sobolewski, Roman
Volume :
19
Issue :
3
fYear :
2009
fDate :
6/1/2009 12:00:00 AM
Firstpage :
346
Lastpage :
349
Abstract :
Dark counts in superconducting single-photon detectors (SSPDs) manifest themselves as spontaneous, transient voltage pulses, typically indistinguishable from photon counts. We present here a new readout technique based on integrating the SSPD with a low-noise, cryogenic high-electron-mobility transistor (HEMT) with high-input impedance. This arrangement allowed us to achieve amplitude resolution of the recorded output transients. In two-dimensional superconducting nanostripes, the physics of photon counting is based on the hotspot formation mechanism, while the dark counts correspond to voltage transients triggered by the vortex-antivortex motion and/or phase-slip centers. Thus, their respective transients can be distinguished by comparing the output pulse amplitude distributions. Our scheme also allowed us to perform photon-energy-resolution studies by comparing the SSPD output pulse amplitude distributions (the mean pulse amplitude and the distribution width) collected for incident single photons with different energies.
Keywords :
high electron mobility transistors; niobium compounds; superconducting photodetectors; 2D superconducting nanostripes; HEMT based readout; NbN; dark count; high electron mobility transistor; photon count; superconducting single photon detectors; transient voltage pulses; vortex-antivortex motion; Dark counts; photon spectral resolution; photon-number resolution; superconducting nanowires; superconducting single-photon detectors;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2009.2018191
Filename :
5153014
Link To Document :
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