• DocumentCode
    1122003
  • Title

    Power grid analysis using random walks

  • Author

    Qian, Haifeng ; Nassif, Sani R. ; Sapatnekar, Sachin S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Minnesota, Minneapolis, MN, USA
  • Volume
    24
  • Issue
    8
  • fYear
    2005
  • Firstpage
    1204
  • Lastpage
    1224
  • Abstract
    This paper presents a class of power grid analyzers based on a random-walk technique. A generic algorithm is first demonstrated for dc analysis, with linear runtime and the desirable property of localizing computation. Next, by combining this generic analyzer with a divide-and-conquer strategy, a single-level hierarchical method is built and extended to multilevel and "virtual-layer" hierarchy. Experimental results show that these algorithms not only achieve speedups over the generic random-walk method, but also are more robust in solving various types of industrial circuits. Finally, capacitors and inductors are incorporated into the framework, and it is shown that transient analysis can be carried out efficiently. For example, dc analysis of a 71 K-node power grid with C4 pads takes 4.16 s; a 348 K-node wire-bond dc power grid is solved in 93.64 s; transient analysis of a 642 K-node power grid takes 2.1 s per timestep.
  • Keywords
    VLSI; capacitance; inductance; integrated circuit design; power supply circuits; statistical analysis; 2.1 s; 4.16 s; dc analysis; divide and conquer strategy; generic algorithm; power grid analysis; random walks; single level hierarchical method; virtual layer hierarchy; Capacitance; Capacitors; Circuit simulation; Inductors; Integrated circuit interconnections; Power grids; Transient analysis; Very large scale integration; Voltage; Wire; Capacitance; inductance; physical design; power grid; random walk; simulation; supply network;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.850863
  • Filename
    1487560