Title :
Fine-grained transaction-level verification: using a variable transactor for improved coverage at the signal level
Author :
Ara, Koji ; Suzuki, Kei
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Abstract :
Maintaining coverage with increasing circuit scale has become a critical problem for logic-verification processes. While transaction-level verification (TLV) is an important step forward, fine-grained (FG) TLV provides better signal-level coverage by reactively changing transactors instead of transaction-level scenarios. Evaluations with a microprocessor design show the effectiveness of FGTLV; all design bugs at the signal level were to be detected, though many were not detected by plain TLV.
Keywords :
formal verification; integrated circuit design; integrated logic circuits; logic CAD; functional coverage; logic verification; microprocessor design; transaction level verification; variable transactor; Automata; Automatic testing; Circuit simulation; Computer bugs; Hardware design languages; Microprocessors; Productivity; Signal design; Signal processing; Timing; Functional coverage; simulation; transaction-level verification; transactor;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.850840