• DocumentCode
    1122024
  • Title

    Fine-grained transaction-level verification: using a variable transactor for improved coverage at the signal level

  • Author

    Ara, Koji ; Suzuki, Kei

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • Volume
    24
  • Issue
    8
  • fYear
    2005
  • Firstpage
    1234
  • Lastpage
    1240
  • Abstract
    Maintaining coverage with increasing circuit scale has become a critical problem for logic-verification processes. While transaction-level verification (TLV) is an important step forward, fine-grained (FG) TLV provides better signal-level coverage by reactively changing transactors instead of transaction-level scenarios. Evaluations with a microprocessor design show the effectiveness of FGTLV; all design bugs at the signal level were to be detected, though many were not detected by plain TLV.
  • Keywords
    formal verification; integrated circuit design; integrated logic circuits; logic CAD; functional coverage; logic verification; microprocessor design; transaction level verification; variable transactor; Automata; Automatic testing; Circuit simulation; Computer bugs; Hardware design languages; Microprocessors; Productivity; Signal design; Signal processing; Timing; Functional coverage; simulation; transaction-level verification; transactor;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.850840
  • Filename
    1487562