• DocumentCode
    1122034
  • Title

    Hierarchical approach to exact symbolic analysis of large analog circuits

  • Author

    Tan, Sheldon X D ; Guo, Weikun ; Qi, Zhenyu

  • Author_Institution
    Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
  • Volume
    24
  • Issue
    8
  • fYear
    2005
  • Firstpage
    1241
  • Lastpage
    1250
  • Abstract
    This paper proposes a novel approach to the exact symbolic analysis of very large analog circuits. The new method is based on determinant decision diagrams (DDDs) representing symbolic product terms. But instead of constructing DDD graphs directly from a flat circuit matrix, the new method constructs DDD graphs in a hierarchical way based on hierarchically defined circuit structures. The resulting algorithm can analyze much larger analog circuits exactly than before. The authors show that exact symbolic expressions of a circuit are cancellation-free expressions when the circuit is analyzed hierarchically. With this, the authors propose a novel symbolic decancellation process, which essentially leads to the hierarchical DDD graph constructions. The new algorithm partially avoids the exponential DDD construction time by employing more efficient DDD graph operations during the hierarchical construction. The experimental results show that very large analog circuits, which cannot be analyzed exactly before like μA725 and other unstructured circuits up to 100 nodes, can be analyzed by the new approach for the first time. The new approach significantly improves the exact symbolic capacity and promises huge potentials for the applications of exact symbolic analysis.
  • Keywords
    analogue integrated circuits; circuit simulation; decision diagrams; graph theory; analog circuits; circuit simulation; decancellation process; determinant decision diagrams; exact symbolic analysis; hierarchical approach; Algorithm design and analysis; Analog circuits; Circuit analysis; Circuit optimization; Circuit simulation; Circuit stability; Circuit synthesis; Circuit testing; Frequency; Performance gain; Behavioral modeling; circuit simulation; symbolic analysis;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2005.850812
  • Filename
    1487563