Title :
Technology and Performance of THz Hot-Electron Bolometer Mixers
Author :
Il´in, Konstantin S. ; Stockhausen, Axel ; Scheuring, Alexander ; Siegel, Michael ; Semenov, Alexei D. ; Richter, Heiko ; Huebers, Heinz-Wilhelm
Author_Institution :
Inst. for Micro- & Nanoelectronic Syst., Univ. of Karlsruhe, Karlsruhe, Germany
fDate :
6/1/2009 12:00:00 AM
Abstract :
Hot-electron bolometer (HEB) mixers are a complex multi-layer thin film structure containing an ultra-thin superconducting film of NbN as a detecting element and a thick normal metal layer as an antenna structure. We have optimized the fabrication process starting with ultra-thin NbN films, Au films for antenna structures and their patterning using e-beam lithography and lift-off. The coupling between normal conducting antenna and NbN detector has been improved by introducing an intermediate NbN film to reduce proximity suppression of superconductivity in the detecting element. A critical temperature of about 9.5 K is reached for NbN films with a thickness between 5 nm and 6 nm. A twofold increase of the film thickness increases the critical temperature to 12 K. We have shown that a 20 nm thick buffer layer of NbN under a much thicker Au layer is sufficient to ensure a critical temperature of the bi-layer of 9 K. This value is close to the critical temperature of 5.5 nm thick HEB devices. The noise temperature of HEB mixer made using improved technology is about 800 K and was measured in a liquid cryogen free system with a quantum cascade laser as 2.5 THz local oscillator.
Keywords :
bolometers; electron beam lithography; submillimetre wave mixers; superconducting thin films; HEB mixer; THz hot-electron bolometer mixers; antenna structure; complex multi-layer thin film structure; e-beam lithography; fabrication process; frequency 2.5 THz; liquid cryogen free system; local oscillator; normal conducting antenna; quantum cascade laser; ultra-thin superconducting film; Niobium nitride; THz mixer; proximity effect; superconducting hot-electron bolometer detector;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2009.2018266