DocumentCode
1122228
Title
Aspects of dissipation effects on the supercurrent decay of Josephson systems
Author
Silvestrini, Palo
Author_Institution
Istituto di Cibernetica del Consiglio Nazionale delle Ricerche, Arco Felice, Italy
Volume
27
Issue
2
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
3260
Lastpage
3263
Abstract
The effect of the voltage-dependent junction resistance R j on the critical current decay of Josephson junctions was studied. In the thermal regime, the author has obtained a simple expression for the lifetime of the zero-voltage state which takes into account the nonlinear dependence of R j on the voltage, removing an assumption of the resistivity shunted junction model (RSJ), which assumes an ohmic shunt resistance to describe the junction dissipation. These results are confirmed by experimental data which also show the relevance of the intrinsic dissipation due to the presence of quasiparticles. This latter aspect is relevant, because it allows extremely underdamped systems to be obtained at low temperatures. These conditions are particularly interesting to study a macroscopic quantum aspect, namely the effects of the presence of quantized energy levels on the supercurrent decay. The dependence of this latter effect on the junction resistance is also briefly discussed
Keywords
Josephson effect; critical currents; superconducting junction devices; Josephson systems; critical current decay; dissipation effects; extremely underdamped systems; intrinsic dissipation; lifetime; macroscopic quantum aspect; nonlinear dependence; quantized energy levels; quasiparticles; supercurrent decay; voltage-dependent junction resistance; zero-voltage state; Capacitance; Critical current; Josephson junctions; Microscopy; Plasma temperature; Superconductivity; Temperature dependence; Thermal resistance; Tunneling; Voltage;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.133907
Filename
133907
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