• DocumentCode
    1122228
  • Title

    Aspects of dissipation effects on the supercurrent decay of Josephson systems

  • Author

    Silvestrini, Palo

  • Author_Institution
    Istituto di Cibernetica del Consiglio Nazionale delle Ricerche, Arco Felice, Italy
  • Volume
    27
  • Issue
    2
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    3260
  • Lastpage
    3263
  • Abstract
    The effect of the voltage-dependent junction resistance R j on the critical current decay of Josephson junctions was studied. In the thermal regime, the author has obtained a simple expression for the lifetime of the zero-voltage state which takes into account the nonlinear dependence of Rj on the voltage, removing an assumption of the resistivity shunted junction model (RSJ), which assumes an ohmic shunt resistance to describe the junction dissipation. These results are confirmed by experimental data which also show the relevance of the intrinsic dissipation due to the presence of quasiparticles. This latter aspect is relevant, because it allows extremely underdamped systems to be obtained at low temperatures. These conditions are particularly interesting to study a macroscopic quantum aspect, namely the effects of the presence of quantized energy levels on the supercurrent decay. The dependence of this latter effect on the junction resistance is also briefly discussed
  • Keywords
    Josephson effect; critical currents; superconducting junction devices; Josephson systems; critical current decay; dissipation effects; extremely underdamped systems; intrinsic dissipation; lifetime; macroscopic quantum aspect; nonlinear dependence; quantized energy levels; quasiparticles; supercurrent decay; voltage-dependent junction resistance; zero-voltage state; Capacitance; Critical current; Josephson junctions; Microscopy; Plasma temperature; Superconductivity; Temperature dependence; Thermal resistance; Tunneling; Voltage;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.133907
  • Filename
    133907