DocumentCode
1122256
Title
Yield enhancement of programmable ASIC arrays by reconfiguration of circuit placements
Author
Narasimham, J. ; Nakajima, K. ; Rim, C.S. ; Dahbura, A.T.
Author_Institution
T.J. Watson Res. Centre, IBM Res. Div., Yorktown Heights, NY, USA
Volume
13
Issue
8
fYear
1994
fDate
8/1/1994 12:00:00 AM
Firstpage
976
Lastpage
986
Abstract
In an approach recently proposed for the yield enhancement of programmable gate arrays (PGA´s), an initial placement of a circuit is first obtained using a standard technique such as simulated annealing on a defect-free PGA. In the next step, this placement is reconfigured so that the circuit is mapped onto the defect-free portion of a defective PGA chip with the same architecture. We first formulate the reconfiguration aspect of this approach as a problem of shifting pebbles on a graph. We present efficient reconfiguration algorithms for this pebble shift problem. Using these algorithms as heuristics, we develop a yield enhancement system not only for PGA´s, but also for programmable Wafer Scare Integrated (WSI) processor arrays. We evaluate the heuristic algorithms using the measures of routability and total wire length of the reconfigured placement of the circuit. Based on this evaluation, we establish proper reconfiguration strategies
Keywords
VLSI; application specific integrated circuits; circuit layout CAD; logic arrays; network routing; simulated annealing; circuit placement reconfiguration; defective PGA chip; heuristic algorithms; pebble shift problem; programmable ASIC arrays; programmable gate arrays; programmable wafer scale integrated processor arrays; routability; simulated annealing; total wire length; yield enhancement; Application specific integrated circuits; Circuit simulation; Electronics packaging; Heuristic algorithms; Integrated circuit yield; Logic arrays; Logic programming; Phased arrays; Programmable logic arrays; Simulated annealing;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.298034
Filename
298034
Link To Document