Parameter limit of the Josephson effect in small superconducting microbridges

An experimental study of small superconducting microbridges in order to examine parameter conditions (i.e., junction resistance and junction inductance) necessary for these junctions to exhibit the Josephson effect is described. Nb variable thickness junctions with very narrow width (<50 nm) and short length (<100 nm) were fabricated using electron beam lithography. The junctions which showed the Josephson effect were thinned by ion beam etching, and consequent changes of junction characteristics were measured. The experimental results indicate that the Josephson effect disappears at some critical resistance. These parameter limits of the Josephson junction are compared with theory