• DocumentCode
    1122296
  • Title

    Microstrip ring resonator technique for measuring microwave attenuation in high-Tc superconducting thin films

  • Author

    Takemoto, June H. ; Oshita, Floyd K. ; Fetterman, Harold R. ; Kobrin, Paul ; Sovero, Emilio

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    37
  • Issue
    10
  • fYear
    1989
  • fDate
    10/1/1989 12:00:00 AM
  • Firstpage
    1650
  • Lastpage
    1652
  • Abstract
    Microwave attenuation of high-Tc superconducting (HTS) films sputtered on MgO and ZrO2 were measured using a microstrip ring resonator circuit. The results of Y-Ba-Cu-O and Bi-Sr-Ca-Cu-O resonators were compared to those for gold-plated resonators of identical design. The losses of superconducting and gold-plated films were determined from unloaded Q-factor measurements. The attenuation of Y-Ba-Cu-O film on an MgO substrate is approximately 31% lower than that of gold films at 6.6 GHz and 33% lower at 19.2 GHz for temperatures below 50 K. The approach of using microstrips to characterize microwave losses shows the usefulness of HTS films in integrated circuit technology
  • Keywords
    Q-factor measurement; attenuation measurement; high-temperature superconductors; microwave integrated circuits; microwave measurement; resonators; strip line components; superconducting thin films; 19.2 GHz; 40 to 72 K; 6.6 GHz; BiSrCaCuO-MgO; BiSrCaCuO-ZrO2; MIC; MgO; SHF; YBaCuO-MgO; YBaCuO-ZrO2; ZrO2; high-Tc superconducting thin films; integrated circuit technology; losses; microstrip ring resonator technique; microwave attenuation; unloaded Q-factor measurements; Attenuation measurement; High temperature superconductors; Microstrip resonators; Microwave circuits; Microwave measurements; Microwave theory and techniques; Optical ring resonators; Superconducting films; Superconducting microwave devices; Yttrium barium copper oxide;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.41013
  • Filename
    41013