DocumentCode
1122307
Title
In this issue - Technically
Author
Terzian, R.C.
Author_Institution
TRW Systems Group Redando Beach, Calif. 90278
Issue
5
fYear
1974
Firstpage
717
Lastpage
718
Abstract
Provides an overview of the technical articles and features presented in this issue.
Keywords
Bit error rate; Degradation; Detectors; Distribution functions; Elliptic curve cryptography; Equations; Error analysis; Gaussian distribution; Laboratories; Sufficient conditions;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/TAES.1974.307868
Filename
4101300
Link To Document