Title :
In this issue - Technically
Author_Institution :
TRW Systems Group Redando Beach, Calif. 90278
Abstract :
Provides an overview of the technical articles and features presented in this issue.
Keywords :
Bit error rate; Degradation; Detectors; Distribution functions; Elliptic curve cryptography; Equations; Error analysis; Gaussian distribution; Laboratories; Sufficient conditions;
Journal_Title :
Aerospace and Electronic Systems, IEEE Transactions on
DOI :
10.1109/TAES.1974.307868
