Title :
Characteristics of superconducting flux-flow transistors
Author :
Hohenwarter, G.K.G. ; Martens, J.S. ; Thompson, J.H. ; Beyer, J.B. ; Nordman, J.E. ; Ginley, D.S.
Author_Institution :
Hypres Inc., Elmsford, NY, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
The operational characteristics and physics of three superconducting thin-film-based transistor structures are compared. The devices are based on the motion of quantized vortices, either Josephson fluxons in a long tunnel junction of Abrikosov fluxons in a superconducting film. The transistor amplification mechanism is accomplished by controlling magnetic field at the boundaries of the structures. An overview of the present understanding of device mechanisms and measured characteristics, including voltampere relations and small and large signal circuit parameters is provided. Demonstrated applications and anticipated limitations are discussed
Keywords :
Josephson effect; flux flow; superconducting junction devices; superconducting thin films; Abrikosov fluxons; Josephson fluxons; circuit parameters; device mechanisms; magnetic field; operational characteristics; quantized vortices; superconducting flux-flow transistors; thin-film-based transistor structures; transistor amplification mechanism; voltampere relations; Circuits; Impedance; Josephson junctions; Magnetic field measurement; Magnetic fields; Physics; Superconducting films; Superconducting thin films; Thin film transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
