DocumentCode :
1122364
Title :
How accurately can one reconstruct an index profile from transverse measurement data?
Author :
Glantschnig, Werner J.
Author_Institution :
AT&;T Technologies, Inc., Princeton, NJ, USA
Volume :
3
Issue :
3
fYear :
1985
fDate :
6/1/1985 12:00:00 AM
Firstpage :
678
Lastpage :
683
Abstract :
The question posed by the title is addressed by analyzing the size dependence of the reconstruction error del\\tan (\\bar{r}) = n (\\bar{r})_{reconst} - n (\\bar{r})_{true} on the numerical aperture of the glass structure being profiled. This error is generated by means of computer simulation for two commonly used reconstruction methods. One method is accurate in the sense that it is based on rigorous ray theory and its use is shown to lead to only insignificant numerical errors. The second method is based on an approximate treatment of the ray equation and its application results in a systematic reconstruction error of magnitude n(R)\\Delta ^{2}/2 . Hence, the latter method provides increasingly less accurate results as Δ increases. If one considers a reconstruction error of 1 part in 104acceptable, then application of either method leads to satisfactory results in fiber-preform profiling work. However, care should be exercised in assessing the adequacy of a particular profile reconstruction method if it is to be used in profiling work on objects characterized by a larger numerical aperture than that typical of fiber preforms.
Keywords :
Optical fiber measurements; Apertures; Computer errors; Computer simulation; Equations; Glass; Optical refraction; Particle measurements; Preforms; Reconstruction algorithms; Testing;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.1985.1074221
Filename :
1074221
Link To Document :
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