• DocumentCode
    1122364
  • Title

    How accurately can one reconstruct an index profile from transverse measurement data?

  • Author

    Glantschnig, Werner J.

  • Author_Institution
    AT&;T Technologies, Inc., Princeton, NJ, USA
  • Volume
    3
  • Issue
    3
  • fYear
    1985
  • fDate
    6/1/1985 12:00:00 AM
  • Firstpage
    678
  • Lastpage
    683
  • Abstract
    The question posed by the title is addressed by analyzing the size dependence of the reconstruction error del\\tan (\\bar{r}) = n (\\bar{r})_{reconst} - n (\\bar{r})_{true} on the numerical aperture of the glass structure being profiled. This error is generated by means of computer simulation for two commonly used reconstruction methods. One method is accurate in the sense that it is based on rigorous ray theory and its use is shown to lead to only insignificant numerical errors. The second method is based on an approximate treatment of the ray equation and its application results in a systematic reconstruction error of magnitude n(R)\\Delta ^{2}/2 . Hence, the latter method provides increasingly less accurate results as Δ increases. If one considers a reconstruction error of 1 part in 104acceptable, then application of either method leads to satisfactory results in fiber-preform profiling work. However, care should be exercised in assessing the adequacy of a particular profile reconstruction method if it is to be used in profiling work on objects characterized by a larger numerical aperture than that typical of fiber preforms.
  • Keywords
    Optical fiber measurements; Apertures; Computer errors; Computer simulation; Equations; Glass; Optical refraction; Particle measurements; Preforms; Reconstruction algorithms; Testing;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.1985.1074221
  • Filename
    1074221