DocumentCode :
1122495
Title :
Handling Memory Overflow in Connected Component Labeling Applications
Author :
Dinstein, Its Hak ; Yen, David W.L. ; Flickner, Myron D.
Author_Institution :
Department of Electrical and Computer Engineering, Ben-Gurion University, Beersheva, Israel; IBM Research Laboratory, San Jose, CA 95193.
Issue :
1
fYear :
1985
Firstpage :
116
Lastpage :
121
Abstract :
The storage requirements for component labeling and feature extraction operations are unknown a priori. Whenever large images are processed, many labels, and thus a large amount of storage, may be required, making hardware implementation difficult. The proposed labeling procedure eliminates memory overflow by enabling the reuse of memory locations in which features of nonactive labels had been stored. The storage requirement for the worst case conditions is analyzed and is shown to be realizable. The basic procedure can be implemented in two modes, an interrupted mode or a parallel mode. A hardware design is presented.
Keywords :
Electrons; Feature extraction; Hardware; Image storage; Labeling; Laboratories; Logic; Machine learning; Notice of Violation; Pattern recognition; Component labeling; feature extraction; image processing; visual inspection;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.1985.4767627
Filename :
4767627
Link To Document :
بازگشت