• DocumentCode
    1122495
  • Title

    Handling Memory Overflow in Connected Component Labeling Applications

  • Author

    Dinstein, Its Hak ; Yen, David W.L. ; Flickner, Myron D.

  • Author_Institution
    Department of Electrical and Computer Engineering, Ben-Gurion University, Beersheva, Israel; IBM Research Laboratory, San Jose, CA 95193.
  • Issue
    1
  • fYear
    1985
  • Firstpage
    116
  • Lastpage
    121
  • Abstract
    The storage requirements for component labeling and feature extraction operations are unknown a priori. Whenever large images are processed, many labels, and thus a large amount of storage, may be required, making hardware implementation difficult. The proposed labeling procedure eliminates memory overflow by enabling the reuse of memory locations in which features of nonactive labels had been stored. The storage requirement for the worst case conditions is analyzed and is shown to be realizable. The basic procedure can be implemented in two modes, an interrupted mode or a parallel mode. A hardware design is presented.
  • Keywords
    Electrons; Feature extraction; Hardware; Image storage; Labeling; Laboratories; Logic; Machine learning; Notice of Violation; Pattern recognition; Component labeling; feature extraction; image processing; visual inspection;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.1985.4767627
  • Filename
    4767627