• DocumentCode
    1122610
  • Title

    Regularity Analysis for Patterned Texture Inspection

  • Author

    Ngan, Henry Y T ; Pang, Grantham K H

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong
  • Volume
    6
  • Issue
    1
  • fYear
    2009
  • Firstpage
    131
  • Lastpage
    144
  • Abstract
    This paper considers regularity analysis for patterned texture material inspection. Patterned texture-like fabric is built on a repetitive unit of a pattern. Regularity is one of the most important features in many textures. In this paper, a new patterned texture inspection approach called the regular bands (RB) method is described. First, the properties of textures and the meaning of regularity measurements are presented. Next, traditional regularity analysis for patterned textures is introduced. Many traditional approaches such as co-occurrence matrices, autocorrelation, traditional image subtraction and hash function are based on the concept of periodicity. These approaches have been applied for image retrieval, image synthesis, and defect detection of patterned textures. In this paper, a new measure of periodicity for patterned textures is described. The Regular Bands method is based on the idea of periodicity. A detailed description of the RB method with definitions, procedures, and explanations is given. There is also a detailed evaluation using the Regular Bands of some patterned textures. Three kinds of patterned fabric samples are used in the evaluation and a high detection success rate is achieved. Finally, there is a discussion of the method and some conclusions.
  • Keywords
    automatic optical inspection; image texture; textile industry; fabric inspection; patterned texture material inspection; regular band method; regularity analysis; regularity measurement; textile industry; Fabric inspection; patterned texture analysis; periodicity; regular bands; regularity analysis;
  • fLanguage
    English
  • Journal_Title
    Automation Science and Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5955
  • Type

    jour

  • DOI
    10.1109/TASE.2008.917140
  • Filename
    4483674