DocumentCode :
1122705
Title :
Compact Semiconductor Tapers for Deep-to-Shallow Etch Transitions
Author :
Strain, M.J. ; Sorel, M.
Author_Institution :
Glasgow Univ., Glasgow
Volume :
19
Issue :
19
fYear :
2007
Firstpage :
1544
Lastpage :
1546
Abstract :
Double-etched taper devices for application as mode converters between shallow and deep-etched waveguides are presented with particular attention paid to the derivation of the taper profile. Finite-difference time-domain simulations of the devices are carried out and compared with fabricated devices along with a transfer matrix method representation that confirms the extraction of values for reflectivity from the transmission spectra of the devices. Tapers of sub-100-mum lengths are shown to exhibit losses of <0.5 dB and reflectivities of <0.05%.
Keywords :
finite difference time-domain analysis; integrated optics; optical couplers; optical waveguides; semiconductor devices; compact semiconductor tapers; deep etched waveguides; deep-to-shallow etch transitions; double-etched taper devices; finite difference time domain simulations; mode converters; reflectivity; shallow etched waveguides; transfer matrix; Capacitive sensors; Etching; Finite difference methods; Optical losses; Optical waveguides; Reflectivity; Refractive index; Time domain analysis; Waveguide components; Waveguide transitions; Deeply etched; integrated optics; low loss; mode converter; tapers;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2007.903886
Filename :
4303180
Link To Document :
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