• DocumentCode
    1122791
  • Title

    Space-Time Domain Expansion Approach to VLSI and Its Application to Hierarchical Scene Matching

  • Author

    Cheng, Heng-Da ; Lin, Wei-Chung ; Fu, King-Sun

  • Author_Institution
    School of Electrical Engineering, Purdue University, West Lafayette, IN 47907.
  • Issue
    3
  • fYear
    1985
  • fDate
    5/1/1985 12:00:00 AM
  • Firstpage
    306
  • Lastpage
    319
  • Abstract
    VLSI technology has recently received increasing attention due to its high performance and high reliability. Designing a VLSI structure systematically for a given task becomes a very important problem to many computer engineers. In this paper, we present a method to transform a recursive computation task into a VLSI structure systematically. The main advantages of this approach are its simplicity and completeness. Several examples, such as vector inner product, matrix multiplication, convolution, comparison operations in relational database and fast Fourier transformation (FFT), are given to demonstrate the transformation procedure. Finally, we apply the proposed method to hierarchical scene matching. Scene matching refers to the process of locating or matching a region of an image with a corresponding region of another view of the same image taken from a different viewing angle or at a different time. We first present a constant threshold estimation for hierarchical scene matching. The VLSI implementation of the hierarchical scene matching is then described in detail.
  • Keywords
    Application software; Convolution; Design engineering; Helium; Layout; Relational databases; Reliability engineering; Space technology; Systolic arrays; Very large scale integration; Geometric transformation; VLSI technique; image pyramid; intensity transformation; sequential hierarchical scene matching; space-time domain expansion; threshold estimation;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.1985.4767659
  • Filename
    4767659