Title :
Low frequency noise in resonant Josephson soliton oscillators
Author :
Hansen, J.B. ; Holst, T. ; Wellstood, Frederick C. ; Clarke, John
Author_Institution :
Phys. Lab I, Tech. Univ. of Denmark, Lyngby, Denmark
fDate :
3/1/1991 12:00:00 AM
Abstract :
The noise in the resonant soliton mode of long and narrow Josephson tunnel junctions (Josephson transmission lines or JTLs) have been measured in the frequency range from 0.1 Hz to 25 kHz by means of a DC SQUID. The measured white noise was found, to within a factor of two, to be equal to the Nyquist voltage noise in a resistance equal to the dynamic resistance RD of the current-voltage characteristic of the bias point. In contrast, measurements of the linewidth of the microwave radiation from the same JTL showed that the spectral density of the underlying noise voltage scaled as R D2/RS where RS is the static resistance. The origin of the different behavior is not known
Keywords :
Josephson effect; SQUIDs; electric noise measurement; electron device noise; microwave oscillators; solid-state microwave circuits; solitons; superconducting junction devices; white noise; 0.1 Hz to 25 kHz; DC SQUID; Josephson transmission lines; Nyquist voltage noise; bias point; current-voltage characteristic; dynamic resistance; linewidth; microwave radiation; resonant Josephson soliton oscillators; spectral density; static resistance; tunnel junctions; underlying noise voltage; white noise; Current measurement; Electrical resistance measurement; Frequency measurement; Low-frequency noise; Noise measurement; Oscillators; Resonance; SQUIDs; Solitons; Transmission line measurements;
Journal_Title :
Magnetics, IEEE Transactions on
