DocumentCode :
1123027
Title :
Investigation of BCN Films Deposited at Various \\hbox {N}_{2/}\\hbox {Ar} Flow Ratios by DC Reactive Magnetron Sputtering
Author :
Xu, Shuyan ; Ma, Xinxin ; Su, Mingren
Author_Institution :
Sch. of Mater. Sci. & Eng., Harbin Inst. of Technol.
Volume :
34
Issue :
4
fYear :
2006
Firstpage :
1199
Lastpage :
1203
Abstract :
In this paper, boron carbonitride films were deposited by a dc reactive unbalanced magnetron sputtering of conductive B4C target in a mixture gas of nitrogen and argon. The films with various content of N were obtained by a varying N2/Ar flow ratio in the mixed gas from 0/100 to 30/100. Structures and compositions of the films were investigated by X-ray photoelectron spectroscopy (XPS) and Fourier transform infrared spectroscopy (FTIR). The results show that the content of B, C, N, and the ratio of each element binding states depend on the ratio of N2/Ar flow. The nitrogen content showed the rising tendency and then came to the saturation stage with an increasing N2/Ar flow ratio. The maximal N content of 33.1 at.% was obtained when N2/Ar flow ratio was 30/100. Nitrogen in the film is prior to binding with B forming sp2 B-N bond, and then with C forming sp2 C-N bond, when the N2/Ar ratio is over a certain value during the nitrogen was introduced into a vacuum chamber. The results of the FTIR indicate that the film is a compound of B-C-N atomic hybridization
Keywords :
Fourier transform spectra; X-ray photoelectron spectra; binding energy; bonds (chemical); boron compounds; infrared spectra; sputter deposition; sputtered coatings; BCN; BCN film; Fourier transform infrared spectroscopy; N2-Ar flow ratio; X-ray photoelectron spectroscopy; atomic hybridization; boron carbonitride film; conductive B4C target; dc reactive unbalanced magnetron sputtering; element binding state; film composition; film structure; nitrogen -argon gas; sp2 bond; vacuum chamber; Argon; Bonding; Boron; Conductive films; Fourier transforms; Infrared spectra; Nitrogen; Saturation magnetization; Spectroscopy; Sputtering; Bonding configurations; Fourier transform infrared spectroscopy (FTIR); X-ray photoelectron spectroscopy (XPS); boron carbonitride (BCN) film;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2006.879179
Filename :
1673507
Link To Document :
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