DocumentCode
1123254
Title
Entropy and Distance of Random Graphs with Application to Structural Pattern Recognition
Author
Wong, Andrew K.C. ; You, Manlai
Author_Institution
Department of Systems Design Engineering, University of Waterloo, Waterloo, Ont., Canada N2L 3G1.
Issue
5
fYear
1985
Firstpage
599
Lastpage
609
Abstract
The notion of a random graph is formally defined. It deals with both the probabilistic and the structural aspects of relational data. By interpreting an ensemble of attributed graphs as the outcomes of a random graph, we can use its lower order distribution to characterize the ensemble. To reflect the variability of a random graph, Shannon´s entropy measure is used. To synthesize an ensemble of attributed graphs into the distribution of a random graph (or a set of distributions), we propose a distance measure between random graphs based on the minimum change of entropy before and after their merging. When the ensemble contains more than one class of pattern graphs, the synthesis process yields distributions corresponding to various classes. This process corresponds to unsupervised learning in pattern classification. Using the maximum likelihood rule and the probability computed for the pattern graph, based on its matching with the random graph distributions of different classes, we can classify the pattern graph to a class.
Keywords
Design engineering; Distributed computing; Entropy; Merging; Pattern classification; Pattern matching; Pattern recognition; Probability distribution; Systems engineering and theory; Unsupervised learning; Attributed graph; distance; entropy of random graph; graph; probability distribution; random graph; structural pattern recognition; synthesis of graphs; unsupervised classification;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.1985.4767707
Filename
4767707
Link To Document