Title :
Voltage-Triggered Ultrafast Phase Transition in Vanadium Dioxide Switches
Author :
You Zhou ; Xiaonan Chen ; Changhyun Ko ; Zheng Yang ; Mouli, C. ; Ramanathan, Shriram
Author_Institution :
Sch. of Eng. & Appl. Sci., Harvard Univ., Cambridge, MA, USA
Abstract :
Electrically driven metal-insulator transition (MIT) in vanadium dioxide (VO2) is of interest in emerging memory devices, neural computation, and high-speed electronics. We report on the fabrication of out-of-plane VO2 metal-insulator-metal structures and reproducible high-speed switching measurements in these two-terminal devices. We have observed a clear correlation between the electrically driven on/off current ratio and the thermally induced resistance change during MIT. It is also found that sharp MIT could be triggered by the external voltage pulses within 2 ns at room temperature and the achieved on/ off ratio is greater than two orders of magnitude with good endurance.
Keywords :
MIM structures; phase transformations; semiconductor switches; thermal resistance; vanadium compounds; VO2; electrically driven metal-insulator transition; electrically driven on-off current ratio; high-speed electronics; high-speed switching measurements; memory devices; neural computation; out-of-plane metal-insulator-metal structure fabrication; temperature 293 K to 298 K; thermally induced resistance; time 2 ms; two-terminal devices; vanadium dioxide switches; voltage-triggered ultrafast phase transition; Current measurement; Electrical resistance measurement; Electrodes; Pulse measurements; Resistance; Switches; Temperature measurement; Correlated electrons; memory; metal–insulator transition (MIT); ultrafast switch; vanadium dioxide;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2012.2229457