• DocumentCode
    1123522
  • Title

    Reliability of semiconductor lasers for undersea optical transmission systems

  • Author

    Fujita, Osamu ; Nakano, Yoshinori ; Iwane, Genzo

  • Author_Institution
    NTT Atsugi Electrical Communication Labs., Kanagawa, Japan
  • Volume
    3
  • Issue
    6
  • fYear
    1985
  • fDate
    12/1/1985 12:00:00 AM
  • Firstpage
    1211
  • Lastpage
    1216
  • Abstract
    The reliability of laser diodes developed for undersea optical transmission systems is analyzed. Up to 1000 device samples of two types (DC-PBH and VSB) are used. An aging test with constant light power operation of 5 mW is carried out at 10, 50, and 70°C for 10 000 h. The median lifetime at 10°C is conservatively estimated to be 1.6 \\times 10^{6} hours. Failure rate at 10°C is estimated at 250 FIT\´s at 25 years of service for the wear-out failure mode and at less than 50 FIT\´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.
  • Keywords
    Optical fiber transmitters, lasers; Underwater optical fiber systems; Aging; Diode lasers; Inorganic materials; Life estimation; Optical devices; Power system reliability; Semiconductor device reliability; Semiconductor lasers; Testing; Threshold current;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.1985.1074337
  • Filename
    1074337