DocumentCode :
1123522
Title :
Reliability of semiconductor lasers for undersea optical transmission systems
Author :
Fujita, Osamu ; Nakano, Yoshinori ; Iwane, Genzo
Author_Institution :
NTT Atsugi Electrical Communication Labs., Kanagawa, Japan
Volume :
3
Issue :
6
fYear :
1985
fDate :
12/1/1985 12:00:00 AM
Firstpage :
1211
Lastpage :
1216
Abstract :
The reliability of laser diodes developed for undersea optical transmission systems is analyzed. Up to 1000 device samples of two types (DC-PBH and VSB) are used. An aging test with constant light power operation of 5 mW is carried out at 10, 50, and 70°C for 10 000 h. The median lifetime at 10°C is conservatively estimated to be 
hours. Failure rate at 10°C is estimated at 250 FIT\´s at 25 years of service for the wear-out failure mode and at less than 50 FIT\´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.
hours. Failure rate at 10°C is estimated at 250 FIT\´s at 25 years of service for the wear-out failure mode and at less than 50 FIT\´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.Keywords :
Optical fiber transmitters, lasers; Underwater optical fiber systems; Aging; Diode lasers; Inorganic materials; Life estimation; Optical devices; Power system reliability; Semiconductor device reliability; Semiconductor lasers; Testing; Threshold current;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.1985.1074337
Filename :
1074337
Link To Document :
