DocumentCode
1123522
Title
Reliability of semiconductor lasers for undersea optical transmission systems
Author
Fujita, Osamu ; Nakano, Yoshinori ; Iwane, Genzo
Author_Institution
NTT Atsugi Electrical Communication Labs., Kanagawa, Japan
Volume
3
Issue
6
fYear
1985
fDate
12/1/1985 12:00:00 AM
Firstpage
1211
Lastpage
1216
Abstract
The reliability of laser diodes developed for undersea optical transmission systems is analyzed. Up to 1000 device samples of two types (DC-PBH and VSB) are used. An aging test with constant light power operation of 5 mW is carried out at 10, 50, and 70°C for 10 000 h. The median lifetime at 10°C is conservatively estimated to be
hours. Failure rate at 10°C is estimated at 250 FIT\´s at 25 years of service for the wear-out failure mode and at less than 50 FIT\´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.
hours. Failure rate at 10°C is estimated at 250 FIT\´s at 25 years of service for the wear-out failure mode and at less than 50 FIT\´s for the random failure mode with a sufficient margin. Furthermore, it is determined that reliability can be further improved by selection of long-life lasers through an additional third step screening aging.Keywords
Optical fiber transmitters, lasers; Underwater optical fiber systems; Aging; Diode lasers; Inorganic materials; Life estimation; Optical devices; Power system reliability; Semiconductor device reliability; Semiconductor lasers; Testing; Threshold current;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.1985.1074337
Filename
1074337
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