• DocumentCode
    1123582
  • Title

    An Attempt to Arrange BZO Nanorods Into ErBCO Thin Films

  • Author

    Yoshimoto, Takatoshi ; Goto, G. ; Mukaida, M. ; Terasnishi, R. ; Mori, N. ; Yamada, K. ; Funaki, S. ; Yoshida, Y. ; Ichinose, A. ; Matsumoto, K. ; Horii, S. ; Kita, R.

  • Author_Institution
    Kyushu Univ., Fukuoka, Japan
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    3420
  • Lastpage
    3422
  • Abstract
    We arrayed BaZrO3 (BZO) nanorods as artificial pinning centers (APCs) into ErBa2Cu4O7-delta (ErBCO) thin films to obtain a higher critical current density (Jc) in a magnetic field. In order to array BZO nanorods in ErBCO thin films, Zr nanoislands were put on SrTiO3 (STO) substrates as seeds for BZO nanorod growth by using an electron beam lithography (EBL) process, a pulsed laser deposition (PLD) method and a lift off process. After that, we grew ErBCO thin films with BZO nanorods by the PLD method. The Zr nanoislands, arrayed on the STO substrates, were successfully observed by atomic force microscopy (AFM). The Zr nanoislands were 60 ~ 70 nm in diameter and 2 ~ 3 nm in height. Density of the Zr nanoislands was 27.7 mum-2. Through structural analysis using X-ray diffraction and transmission electron microscopy (TEM) observation, it was confirmed that the ErBCO thin films had c-axis orientation with BZO nanorods. After oxygen annealing process, a critical temperature (Tc) of the film was 88.7 K. Jc measurement of the film in a magnetic field revealed that Jc deterioration was suppressed by introduction of the BZO nanorods. However, a Jc increase at the approximate matching field was not confirmed at around 5.6 times 10-2 T calculated from density of the Zr nanoislands.
  • Keywords
    X-ray diffraction; annealing; atomic force microscopy; barium compounds; critical current density (superconductivity); electron beam lithography; erbium compounds; high-temperature superconductors; nanolithography; nanostructured materials; pulsed laser deposition; superconducting thin films; superconducting transition temperature; transmission electron microscopy; BZO nanorods; ErBCO thin films; ErBa2Cu4O7-delta:BaZrO3; TEM; X-ray diffraction; annealing process; artificial pinning centers; atomic force microscopy; critical current density; critical temperature; electron beam lithography; pulsed laser deposition; structural analysis; transmission electron microscopy; BZO nanorods; ErBCO thin film; electron beam lithography; matching field;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2018759
  • Filename
    5153182